5

Surface and interface analysis for the development of VLSI devices

Year:
1989
Language:
english
File:
PDF, 1.01 MB
english, 1989
10

In-situ trace analysis of materials with SIMS

Year:
1983
Language:
english
File:
PDF, 2.23 MB
english, 1983
33

Sekundärionen-Massenspektrometrie

Year:
1994
Language:
german
File:
PDF, 6.33 MB
german, 1994
39

Neural networks for library search of ultraviolet spectra

Year:
1994
Language:
english
File:
PDF, 1.23 MB
english, 1994
42

Ion microprobe analysis of technical materials

Year:
1988
Language:
english
File:
PDF, 8.94 MB
english, 1988
43

Secondary ion mass spectrometry (SIMS) of silicon

Year:
1989
Language:
english
File:
PDF, 1.33 MB
english, 1989
45

Surface analysis of semiconductors with SIMS

Year:
1984
Language:
english
File:
PDF, 985 KB
english, 1984
47

In situ microanalysis—a survey of some major new developments

Year:
1986
Language:
english
File:
PDF, 442 KB
english, 1986
48

Analysis of airborne particles

Year:
1987
Language:
english
File:
PDF, 293 KB
english, 1987
50

Data treatment in atomic spectroscopy

Year:
1988
Language:
english
File:
PDF, 268 KB
english, 1988